摘要
利用电光分析天平、扫描电镜与能谱仪测量与分析了CAgCdO与AgSnO2In2O3触头材料在低压交流50Hz和400Hz、纯阻性、小电流通断试验的表面形貌与组份,探讨了50Hz和400Hz下AgMeO触头材料电弧侵蚀机理。
Using the electronic analytical balance, SEM and EDS, this paper measures and analyzes the changes of CAgCdO15 and AgSnO2 In2O3 contacts material＇s surface profile and constituent during the test process with low voltage resistive load and small current at 50Hz and 400Hz. The paper also discusses the corrosion mechanism of the AgMeO contact materials at 50Hz and 400Hz.
出处
《电工电能新技术》
CSCD
北大核心
2009年第3期11-14,44,共5页
Advanced Technology of Electrical Engineering and Energy
基金
湖南省自然科学基金项目(05JJ40068)
湖南省教育厅项目(04D02)
