摘要
本文简单介绍透射电镜(TEM)和扫描电镜(SEM)用加载样品台的工作原理,并结合NiTi形状记忆合金中的应力诱发相变研究进一步阐明其应用。
This article briefly introduces the operating principle of loading sample stage for trasmission electron microscopy (TEM) and scanning electron microscopy (SEM), and further elucidates its application through the study of stress - induced phase transition in NiTi shape memory alloy.
出处
《上海钢研》
1998年第2期28-32,共5页
Journal of Shanghai Iron and Steel Research
关键词
加载样品台
透射成镜
扫描电镜
形状记忆合金
loading Sample stage trasmission electron microscopy (TEM) scanning elec-tron microscope (SEM) application