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电子显微镜加载样品台在相变研究中的应用

Application of Electron Microscope Loading Sample Stage in Phase Transformation Investigation
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摘要 本文简单介绍透射电镜(TEM)和扫描电镜(SEM)用加载样品台的工作原理,并结合NiTi形状记忆合金中的应力诱发相变研究进一步阐明其应用。 This article briefly introduces the operating principle of loading sample stage for trasmission electron microscopy (TEM) and scanning electron microscopy (SEM), and further elucidates its application through the study of stress - induced phase transition in NiTi shape memory alloy.
作者 金嘉陵
出处 《上海钢研》 1998年第2期28-32,共5页 Journal of Shanghai Iron and Steel Research
关键词 加载样品台 透射成镜 扫描电镜 形状记忆合金 loading Sample stage trasmission electron microscopy (TEM) scanning elec-tron microscope (SEM) application
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参考文献2

  • 1金嘉陵.Ni-Ti合金超弹性及其相变过程的扫描电镜动态研究[J]金属学报,1984(03). 被引量:1
  • 2H. Warlimont,L. Delaey,R. V. Krishnan,H. Tas. Thermoelasticity, pseudoelasticity and the memory effects associated with martensitic transformations[J] 1974,Journal of Materials Science(9):1545~1555 被引量:1
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