期刊文献+

基于标记点的子孔径全局优化拼接检测法 被引量:4

Sub-aperture Stitching Interference Measurement Method Based on Marker Location and Global Optimization
下载PDF
导出
摘要 为实现小口径干涉仪完成较大口径光学平面镜片的测试,得到镜片的完整面形信息,提出了基于标记点的平面Givens变换,实现了子孔径的精确定位。采用Zernike多项式拟合对每个子孔径数据进行了消倾斜量的处理。建立了全局优化拼接数学模型。利用该模型进行了九孔径拼接计算机仿真实验,利用该方法得到的PV值和RMS值的相对误差均在10-6左右。对直径为150mm的镜片进行九孔径拼接检测实验,对比全口径干涉检测结果,PV值和RMS值的相对误差为0.36%和2.27%。仿真和实验结果证明:该方法稳定可靠,降低了传统的子孔径拼接干涉检测方法中对导轨的高精度要求。 In order to obtain the whole lens' surface information, measurement of larger diameter optical plane was implemented by using smaller caliber interferometer. The problem of precise location was solved by the plane Givens transform of markers' position. Each sub-aperture's tilt and piston were removed by Zernike polynomial fitting. Global optimization stitching model was established. Nine sub-apertures stitching computer simulation was accomplished by using the model. The relative error values ofPVand RMS are both about 10-6. A lens of 150 mm in diameter was used in nine sub-apertures stitching experiment. Compared with full caliber interference meastti'ement results, the relative error value of PV is 0.36% and the relative error value of RMS is 2.27%. Simulation and experimental results indicate that the algorithm reduces the requirements of high precision rail in traditional sub-aperture stitching interference measurement.
出处 《光电工程》 CAS CSCD 北大核心 2009年第5期83-87,共5页 Opto-Electronic Engineering
基金 国家863高技术资助项目
关键词 子孔径 干涉检测 全局优化 拼接技术 sub-aperture interference measurement global optimization stitching technology
  • 相关文献

参考文献15

二级参考文献50

  • 1程维明,林有略,陈明仪.多孔径扫描波面恢复技术的精度评定及影响因素[J].光学学报,1993,13(8):711-716. 被引量:9
  • 2林有略,陈明仪.数字波面恢复中的高斯门限法[J].光学学报,1993,13(1):36-41. 被引量:2
  • 3陈宝林.最优化理论与算法[M].北京:清华大学出版社,1998.. 被引量:7
  • 4[2]Masashi Otsubo, Katsuyuki Okada, Jumpei Tsujiuchi. Measurement of large plane surface shapes by connecting small-aperture inteferograms[J]. Opt Eng, 1994, 33(2): 608-613. 被引量:1
  • 5[3]Bray M. Stitching interferometer for large plane optics using a standard interferometer[A]. Proc of SPIE[C]. 1997, 3134: 39-50. 被引量:1
  • 6[4]Bray M. Stitching interferometer for large optics: Recent developments of a system[A]. Proc of SPIE[C].1999, 3492: 946-956. 被引量:1
  • 7[7]Chow W W, Lawrence G N. Method for subaperture testing interferogram reduction[J]. Optics Letters, 1983, 8(9): 468-470. 被引量:1
  • 8[1]Murphy P, Forbes G, Fleig J, et al. Stitching interferometry:a flexible solution for surface metrology[J]. Optics and Photonics News, 2003, 14: 38~43 被引量:1
  • 9[2]Fleig J, Dumas P, Murphy P, et al. An automated subaperture stitching interferometer workstation for spherical and aspherical surfaces[C]. SPIE, 2003, 5188: 296~307 被引量:1
  • 10[3]Tronolone M J, Fleig J F, Huang C S, et al. Method of testing aspherical surfaces with an interferometer[P]. US5416586, 1995 被引量:1

共引文献78

同被引文献20

引证文献4

二级引证文献19

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部