摘要
扩展Ｘ射线吸收精细结构（ＥＸＡＦＳ）谱是研究物质原子近邻结构和表面结构的有力工具。ＥＸＡＦＳ谱的解析通常采用标准样品比较法或最小二乘曲线拟合方法。但前者对标样的要求很高，而后者则参数初值难以确定，且结果有时不唯一。本文提出一种ＥＸＡＦＳ曲线拟合的新方法一遗传算法，并对单配位层Ｃｕ样品的ＥＸＡＦＳ谱图进行了解析，取得满意的结果。
Extended Xray absorption fine structure (EXAFS) has been extensively used in the structural study in recent years.But the current methods of analysis EXAFS spectrum is difficult and tedious,demanding either very similar standard samples or the initial parameters near the solution.In this paper,a new technique Genetic Algorithms(GAs),was applied to the analyzing of the EXAFS spectrum,and two spectra of CU samples were investigated by the method.It was found that reasonable results can be obtained by the method only with limiting the initial parameters to a broad range.Comparing the results with those obtained by EXCURVE88,the fitting is superior,and the parameters are reasonable.Therefore,it is proved that the GAs may be a high performance method for the analyzing of the EXAFS spectra.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1998年第1期106-109,共4页
Spectroscopy and Spectral Analysis
