摘要
基于板级电路加速性能退化数据来研究电子产品可靠性评估问题。对电源整板进行80℃、100℃、120℃下加速退化试验,监测到输出电压随温度变化的退化过程。由试验数据对加速性予以定量验证,并基于Weibull分布采用最小二乘法进行可靠性统计推断。
Reliability assessment based on circuit board accelerated degradation data are studied. In accelerated degradation test is conducted on power supply boards under 80 ℃, 100 ℃ and 120 ℃. The degradating of the output voltage as a function of the temperature are observed. The acceleration of the test are quantitatively validated based on the test data, and the statistical inferences are obtained using the least square estimation based on weibull distribution.
出处
《电子产品可靠性与环境试验》
2009年第1期9-12,共4页
Electronic Product Reliability and Environmental Testing
基金
国家自然科学基金项目(No.60472009)资助
关键词
加速试验
性能退化
可靠性
accelerated test
performance degradation
reliability
