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具有N个故障模型和一个储备部件的可修复系统的稳定性分析

Stability Analysis of a Repairable System with N Failure Mode and one Standby Unit
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摘要 讨论了一个储备部件和N个故障模型的可修复系统的稳定性.证明系统算子的谱点在复平面的左半平面,虚轴上的点除0点外都无谱,且0是系统算子的一个简单本征值.并由此得出系统模型非负时间依赖解趋于稳定解. Discusses stability of a repairable system with N failure mode and one standby unit. We show that 0 is a simple eigenvalue of this system operator and is also a unique spectral point on the imaginary axis. In combination with this, we obtain that the time-dependent solution of the system converges strongly to the steady-state solution.
出处 《数学的实践与认识》 CSCD 北大核心 2008年第23期152-159,共8页 Mathematics in Practice and Theory
关键词 C0-半群 稳定性 可修复系统 Co-Semigroups stability repairable system
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  • 1GeniGupur,GUOBaozhu.ASYMPTOTIC PROPERTY OF THE TIME-DEPENDENT SOLUTION OF A RELIABILITY MODEL[J].Journal of Systems Science & Complexity,2005,18(3):319-339. 被引量:9
  • 2Adams R A 叶其孝 等.Sobolev空间[M].北京:人民教育出版社,1983.. 被引量:1
  • 3Park K S. Human reliability: Analysis, Prediction and prevention of human Errors[M]. Elsevier Science New York, 1987. 被引量:1
  • 4Who Kee Chung. Reliability analysis of a repairable parallel system with standby involving human error and common-cause failures[J]. Microelectron. Reliab, 1987, 27: 269-271. 被引量:1
  • 5Who kee Chung. An availabitity analysis of a k-out-of-N:G redundant system with dependent failure rates and common-cause failures[J]. Microelectron Reliab, 1988, 28: 391-393. 被引量:1
  • 6Dhillon B S. Stochastic analysis of a parallel system with common-cause failures and critical human errors[J].Microelectron Reliab, 1989, 29: 627-637. 被引量:1
  • 7Chair A A, Sastry M P, Verma S M. Reliability analysis in the presence of chance common cause schock failures[J]. Microelectron Reliab, 1991, 31: 15-19. 被引量:1
  • 8Dhillon B S, Yang N. Reliability and availability of warm standby systems with common-cause failures and human errors[J]. Microelectron, Reliab, 1992, 32: 561-575. 被引量:1
  • 9Dhillon B S, Nianfu Yang. Availability of a man-machine system with critical and non-critical human error[J].Microelectron Reliab, 1993, 33: 1511-1521. 被引量:1
  • 10Who Kee Chung. Reliability of imperfect switching of cold standby systems with mul-tiple non-critical and criticol errors[J]. Microelectron Reliab, 1995, 35: 1479-1482. 被引量:1

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