摘要
仿真分析了在π网络测量法中,直插式晶体元件的引线电感和接触电阻对晶体元件参数测量的影响,以及晶体元件的寄生响应对测量的影响.分析结果表明,接触电阻和引线电感对串联谐振频率的影响较小,接触电阻对谐振电阻的大小有直接的影响,主模和寄生响应间隔与晶体参数的测量误差成正比.
Effects of stray impedance and spurious response on parameter measurement of quartz crystal unit using π network method were simulated and analyzed. The results show that contact resistors and induced inductors have lower effects on series resonance frequency, contact resistors have direct effect on resonance resistor, and that the space between main mode and spurious response is proportional to measuring error.
出处
《测试技术学报》
2008年第6期499-504,共6页
Journal of Test and Measurement Technology
关键词
杂散阻抗
晶体元件
晶体参数测量
stray impedance
quartz crystal unit
parameter measurement
