期刊文献+

一种共前缀码的测试数据压缩方案

Scheme of Test Data Compression Based on Sharing-prefixed Code
下载PDF
导出
摘要 提出了一种新的基于游程编码的测试数据压缩/解压缩的算法:共前缀码编码(SPCS),它在传统游程使用较短的代码字来代替较长的游程的基础上,进一步探讨游程之间的相关性,使用一位来代替具有与前一游程相同前缀的后一游程的前缀,使需要多位才能表示的代码字的前缀用一位就可以表示,进一步提高了压缩率。相比类似的编码测试数据压缩方案,具有压缩率高、解压控制过程容易实现的突出特点。理论分析和对ISCAS-85和ISCAS-89部分标准电路硬故障集的实验结果证明了本方案的有效性。 A new scheme of test data compression/decompression, namely sharing-prefixed code scheme (SPCS) was proposed based on run length. It further explored the relationship between two immediate runs on the basis of the traditional characteristic of run length coding which used shorter codeword to represent longer symbol (run-length). This scheme used 1 bit to represent the whole prefix of the later run of two immediate runs whose prefixes were the same. Compared with other schemes, this scheme has some characteristics, such as high compression ratio, easy control and implementation. Theoretical analysis and experimental results for the hard fault set of ISCAS-85 and ISCAS-89 benchmark circuits show that the proposed scheme is a very efficient compression method.
出处 《系统仿真学报》 CAS CSCD 北大核心 2008年第21期5979-5983,共5页 Journal of System Simulation
基金 国家自然科学基金重大研究计划(90407008) 国家973计划项目(2005CB321605) 国家自然科学基金重点项目(60633060) 安徽省自然科学基金(050420103) 安徽省高校青年教师基金(2006jql212)
关键词 测试数据压缩 游程编码 硬故障集 压缩/解压 test data compression run length coding hard fault set compression/decompression
  • 相关文献

参考文献19

  • 1Balakrishnan K J. Emerging Techniques for Test Data Compression [C]// Proceedings of 14th Asian Test Symposium (ATS 2005). USA: IEEE Computer Society Test Technology Technical Council, 2005: 462-462. 被引量:1
  • 2Touba N A. Survey of Test Vector Compression Techniques. [J]. Design & Test of Computers (S0740-7475), 2006, 23(4): 294-303. 被引量:1
  • 3A Chandra Kchakrabarty. System-on-a-Chip test data compression and decompression architectures based on Golomb codes. [J]. IEEE Transitions on CAD of Integrated Circuits and System (S0278-0070), 2001, 20(3): 355-368. 被引量:1
  • 4Chandra A, Chakrabarty K. Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes. [J]. IEEE Transactions on Computers' (S0018-9340), 2003, 52(8): 1076-1088. 被引量:1
  • 5A Chandm, K Chakrabarty, R A Medina. How Effective Axe Compression Codes for Reducing Test Data Volume? [C]// Proceedings of VLSI Test Symposium. USA: IEEE Computer Society, 2002: 1-96. 被引量:1
  • 6A Chandra, K Chakrabarty. Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression [C]//Proc. 19th VLSI Test Symp. Marina Del Rey, CA, USA: IEEE Computer Society, 2001: 42-43. 被引量:1
  • 7Chandm A, Chakrabarty K. Reduction of SOC test data volume, scan power and testing time using using alternating run-length codes [C]// Proceedings of IEEE/ACM Design automation Conference. USA: IEEE Computer Society, 2002: 673-678. 被引量:1
  • 8Wuertenberger A, Tautermann C S, Hellebrand S. A Hybrid Coding Strategy for Optimized Test Data Compression [C]// IEEE International Test Conference. USA: IEEE Computer Society 2003: 451-459. 被引量:1
  • 9梁华国,蒋翠云.基于交替与连续长度码的有效测试数据压缩和解压[J].计算机学报,2004,27(4):548-554. 被引量:70
  • 10S Hellebrand, A Wurtemberger. Alternating Run-Length Coding - A Technique for Improved Test Data Compression [C]// IEEE Int. Workshop on Test Tesource Partitioning. Baltimore, MD, USA: IEEE Computer Society, 2002, 10-15. 被引量:1

二级参考文献56

  • 1韩银和,李晓维,徐勇军,李华伟.应用Variable-Tail编码压缩的测试资源划分方法[J].电子学报,2004,32(8):1346-1350. 被引量:27
  • 2Wold S,Esbensen K,Gelasi E Principle Components Analysis[J].Chemometrics and Intelligent Laboratory Systems, 1987, 12(2):37-46. 被引量:1
  • 3Dunia R, Qin S J. Identification of Faulty Sensors Using Principle Components Analysis [J]. American Institute of Chemical Engineers. AIChE Journal, 1996, 42(10): 2797-2812. 被引量:1
  • 4De Castro L N, Von Zuben F J. The clonal selection algorithm with engineering applications[A]. In Whitley D., Goldber D., Cantu-Paz(eds.). Proceedings of the Genetic and Evolutionary Computation Conference(GECCO'00)[C]. San Francisco: Morgan Kaufmann Publishers, 2000.36-43. 被引量:1
  • 5Hunt J E, Cooke D E. Learning using an artificial immune system[J]. Journal of Network and Computer Applications. I996, I9(2):189-212. 被引量:1
  • 6Fan Youping. Research on theory and approach of reconfigurable intelligent fault diagnosis system and its application[D] Ph.D.Dissertation. Chongqing: Chongqing University, 2003. 被引量:1
  • 7Ma Xiaoxiao. Machine Learning in Intelligent Fault Diagnosis[D].Ph.D. Dissertation. Chongqing: Chongqing University, 2002. 被引量:1
  • 8Mcavoy T J, Ye N. Base Control for the Tennessee Eastman Problem [J]. Computers and Chemical Engineering, 1994, 18(5):383-413. 被引量:1
  • 9Downs J J, Vogel E E A Plant-wide Industrial Control Problem [J].Computers and Chemical Engineering, 1993, 17(3): 245-255. 被引量:1
  • 10Ricker N L. Decentralized Control of the Tennessee Eastman Challenge Process [J]. Journal of Process Control, 1996, 6(4):205 -221. 被引量:1

共引文献96

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部