5ROBIN CLARK. Rail flaw detection :overview and needs for future development. NDT & E International,2004,37 (2) : 111 - 118. 被引量:1
6GUI YUN TIAN, ALI SOPHIAN. Defect classification using a new feature for pulsed eddy current sensors. NDT & E International,2005,38 (1) :77 -82. 被引量:1
7Samsung Electronics. S3CA4BOX USER' S MANUAL. Samsung Electronics, 2005,8. 被引量:1