摘要
用高纯锗半导体γ探测器测量了不同质量的球形高浓铀和贫化铀样品以及两者相组合模型。采用PCFRAM分析软件对测量数据进行了铀丰度分析,研究铀丰度的分析结果与测量时间、不同屏蔽厚度、样品质量和样品的组合模型的关系。结果表明:在一定条件下,测量时间的长短直接影响到分析结果的可靠性;分析结果与铀样品外是否加屏蔽体无关,而是取决于测量能谱中γ射线计数的统计涨落。在保证高质量测量能谱的前提下,可以准确地分析出铀材料的丰度;在高浓铀和贫化铀材料同时存在时,无法区分样品的丰度。
The different mass spherical uranium samples have been measured by high pure germanium gamma detector. Enrichment of uranium was analyzed by PCFRAM software. The relationship between the enrichment and measurement time, and different thick of shielding, and mass of the sample, and the different kind of models of sample have been analysed. The results show that reliability of the enrichment is determined by the measurement time at the certainty condition. Not shielding but statistics is important for the results. The accurate results will be obtained with high quality spectrum. The accurate enrichment of sample is not differentiated when high enriched uranium and depleted uranium exist.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2008年第1期138-141,149,共5页
Nuclear Electronics & Detection Technology
