摘要
从元器件失效的原理出发,叙述了分析元器件失效的具体失效模式与引起各种元器件失效的失效模式之间的相互关联性、各种元器件测试筛选方法可能引发的元器件失效模式,以及不同元器件测试筛选先后次序对最终测试结果的影响,从理论上推导出一种较好的决定元器件测试筛选先后次序的原则。实践表明,应用这种原则,可以最大限度提高测试筛选的有效性和经济性,在最短时间内迅速找出有有缺陷、质量不符合要求的产品,而且失效模式定位准确,为查明失效的产生机理提供数据支持,是一种有效的安排元器件测试筛选先后次序的原则。
On basis of element failure principle, this paper introduces specific element failure modes and inter-relevance between these failure modes, presents possible element failure modes causing from various element test screening and describes effects of different element test screening sequences on final test results, a theoretically better decision principle for element test screening sequence is concluded in this way. It is proven in practice that this principle can help to improve test screening effectiveness and economic efficiency in maximum, locate those faulty or quality-unqualified products in shortest time, offer accurately-located failure modes and provide data support for finding out failure reasons, so this principle turns out to be an effective sequence decision principle for element test screening.
出处
《电子工程师》
2008年第3期9-11,共3页
Electronic Engineer
