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沉积温度对碳膜结构及其场发射特性的影响 被引量:1

The Effects of the Growth Temperature of Carbon Films on Its Structure and Field Emission Properties
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摘要 利用微波等离子体化学气相沉积法在覆盖金属钛层的陶瓷衬底上,利用改变衬底温度方法沉积不同结构的碳膜。通过扫描电子显微镜、拉曼光谱对碳膜进行了分析测试,并研究了不同衬底温度下沉积的碳膜的场致电子发射特性。对于在衬底温度800℃时制备的碳膜,在电场3.3 V/μm时,最大场发射电流密度达1 mA/cm2。 The carbon films were fabricated in different growth temperature by microwave plasma chemical vapor deposition (MPCVD) method, the ceramic with a Ti mental layer was used as substrate. The carbon films were evaluated by Raman scattering spectroscopy and scanning electron microscopy (SEM). The field emission properties were tested by using a diode structure in a vacuum chamber for observing and characterizing the field emission. It was found that the carbon film grown at temperatures of 800℃ exhibited good electron emission properties. An emission current density as high as 1 mA/cm^2 was obtained under the condition of 3.3 V/μm applied field.
出处 《真空电子技术》 2007年第6期59-61,共3页 Vacuum Electronics
关键词 微波等离子体化学气相沉积 场致电子发射 金刚石聚晶 Microwave plasma chemical vapor deposition Field emission Diamond microcrystallineaggregate
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