摘要
用X射线光电子能谱(XPS)研究了3.0keVAr离子轰击高定向裂解石墨(HOPG)引起的表面结构的变化。通过对C1s、CKLL及C2s谱峰形状的定性和定量分析,表明Ar离子轰击将破坏共价π键并导致表面局域sp2杂化C键向sp3杂化C键转化。sp3/sp2之比依赖于离子轰击时间。
Surface structure changes of high oriented pyrolytic graphite induced by 3.0 keV Ar ion bombardment were studied using X-ray photoelectron spectroscopy （XPS）. The spectra, including C1s, X-ray-excited Auger electron spectroscopy and XPS valence band spectroscopy were analyzed qualitatively and quantitatively. Results show that the conjugated π bond can be destroyed and local sp^2 hybridized carbon can be developed into sp^3 hybridized carbon by Ar ion bombardment. The ratio of sp^3 to sp^2 depends on the bombardment time.
出处
《新型炭材料》
SCIE
EI
CAS
CSCD
北大核心
2007年第4期379-382,共4页
New Carbon Materials
关键词
表面分析
Ar离子轰击
高定向裂解石墨
X射线光电子能谱
Surface analysis
Ar ion bombardment
High oriented pyrolytic graphite
X-ray photoelectron spectroscopy
