摘要
借助扫描电子显微镜和X射线能谱仪(SEM-EDAX)对玉米秆表面进行分析,结果表明:玉米秆表面较为平滑、致密,除H外,主要由C、O、Si三种元素组成,含Si量高达30%,其表面零星分布的块状物和棒状物则有较高的S和K含量。
By means of SEM-EDAX,the property and element composition of corn stalk surface are studied. The results show that corn stalk surface is relatively smooth and dense. Besides the element H, the surface consists of three elements,i, e. C, O and Si. The Si content of corn stalk surface is about 30% of the total weight. The S and K content of the small swelling scattered on the surface is relatively high.
出处
《林产工业》
北大核心
2007年第6期23-25,共3页
China Forest Products Industry
基金
湖南省教育厅(04C690)项目部分内容
