摘要
在详细介绍基于电学特性的电子元器件的失效分析方法的基础上,重点阐述了如何从失效元器件的特性曲线出发,来分析和判定电子元器件的失效机理。最后总结了在测试过程中应该注意的问题。
In this paper,we put emphases on introducing how to get out from feature curve of forfeited electronic element to analyze and determine failure mechanism of electronic element based on introduc ing failure analysis of electronic element with electronics character. In the last,sum-up the problem which we should advert in the testing process.
出处
《仪器仪表用户》
2007年第6期113-114,共2页
Instrumentation
关键词
电子元器件
特性曲线
失效分析
electronic element＇,feature curve＇,failure analysis
