摘要
介绍了ＤＳ－２８型定时机构测试仪的研制原理，提出了利用光电耦合器将幅值变化的开关信号转换为ＴＴＬ电平信号的方法，设计了支持硬件及软件结构，并对测量误差进行了分析．
The developing fundamentals of mearsuring set for DS 28 timing mechanism is introduced in this paper. The method of transforming singal from differnt level into TTL level by using optoisolator is proposed. The support measuring hardware and software are designed. Finally, the measuring errors have been analyzed.
出处
《华东交通大学学报》
1997年第2期10-15,共6页
Journal of East China Jiaotong University
关键词
单片机
DS-28型
定时机构测
试仪
研制
timeing mechanism
sequence test
level transform
microcontroller
