期刊文献+

铁电体中相变临界尺寸的研究现状 被引量:2

Progress in Research on Critical Size of Phase Transition in Ferroelectrics
下载PDF
导出
摘要 从铁电薄膜和铁电颗粒两大方面回顾了处理尺寸效应的理论研究方法(包括宏观的热力学唯像理论、微观的横场Ising模型和第一性原理计算)和铁电相变临界尺寸的理论预测.总结了从50年代以来实验中观测到的各种铁电材料的临界尺寸,简单介绍了铁电纳米陶瓷的一些尺寸效应,并叙述了近几年才开始报道的铁电纳米线中的铁电相变.最后指出了目前研究现状中存在的一些问题. Theoretical approaches (such as macroscopic thermodynamics phenomenological approach, microscopic transverse field Ising model and first-principles calculation) in dealing with size effect and predicts on critical size of ferroelectric phase transition are reviewed from two aspects, ferroelectric film and ferr0electric grain, respectively. Critical sizes of some ferroelectrics observed in experiments are summarized from 1950s. Some size effects of ferroelectric ceramics are introduced simply. Ferroelectric phase transitions of ferroelectric nanowires reported recently are narrated too. Finally, some problems in researching progress are pointed out.
出处 《无机材料学报》 SCIE EI CAS CSCD 北大核心 2007年第4期583-589,共7页 Journal of Inorganic Materials
基金 国家重点基础研究发展规划(2002CB613307) 国家自然科学基金(50572113)
关键词 铁电薄膜 铁电颗粒 铁电陶瓷 铁电纳米线 相变临界尺寸 ferroelectric films ferroelectric grains ferroelectric ceramics ferroelectric nanowires critical size of phase transition
  • 相关文献

参考文献4

二级参考文献11

  • 1Haertling, G. H. J. Am. Ceram. Soc., 1999, 82(4): 797 被引量:1
  • 2Wada, S.; Tsurumi, T.; Chikamori, H.; Noma, T.; Suzuki, T. Journal of Crystal Growth, 2001, 229: 433 被引量:1
  • 3Oledzka, M.; Brese, N. E.; Riman, R. E. Chem. Mater., 1999, 11: 1931 被引量:1
  • 4Asiaie, R.; Zhu, W. D.; Akbar, S. A.; Dutta, P. K. Chem. Mater., 1996, 8: 226 被引量:1
  • 5Qi, F.; Manabu, H.; Kazumichi, Y. Chem. Mater., 2001, 13(2): 290 被引量:1
  • 6Uchino, K.; Sadanaga, E.; Hirose, T. J. Am. Ceram. Soc., 1989, 72(8): 1555 被引量:1
  • 7Venkateswaran, U.D.; Naik, V. M.; Naik, R. Physical Review B, 1998, 58: 14256 被引量:1
  • 8Wang, B.; Zhang, L. Phys. Stat. Sol.(a), 1998, 169: 57 被引量:1
  • 9He, Q. Y.; Tang, X. G.; Wu, M. M. Nanostructured Materials, 1999, 11(2): 287 被引量:1
  • 10Choi, G.J.; Lee, S.K.; Woo, K.J.; Cho, Y.S. Chem. Mater., 1998, 10: 4104 被引量:1

共引文献34

同被引文献12

  • 1MCKEE R A, WALKER F J, CHISHOLM M F. Physical structure and inversion charge at a semiconductor interface with a crystalline oxide [J]. Science, 2001, 293: 468-471. 被引量:1
  • 2TYBELL T, PARUCH P, GIAMARCHI T, et al. Domain wall creep in epitaxial ferroelectric Pb(Zr0.2Ti0.8)O-3 thin films [J]. Physical Review Letters, 2002, 89: 097601. 被引量:1
  • 3WANG J, KAMLAH M. Intrinsic switching of polarization vortex in ferroelectric nanotubes [J]. Physical Review B, 2009, 80: 012101. 被引量:1
  • 4Su Y, Du J N. Existence conditions for single-vertex structure of polarization in ferroelectric nanoparticles [J]. Applied Physics Letters, 2009, 95: 012903. 被引量:1
  • 5HONG L, SOH A K, LIU S Y, et al. Vortex structure transformation of BaTi03 nanoparticles through the gradient function [J]. Journal of Applied Physics, 2009, 106: 024111. 被引量:1
  • 6CHEN L Q. Pha~e-field models for microstructure evolution [J]. Annual Review of Materials Research, 2002, 32: 113. 被引量:1
  • 7SOH A K, SON(] Y C, NI Y. Phase field simulations of hysteresis and butterfly loops in ferro- electrics subjected to electro-mechanical coupled loading [J]. Journal of the American Ceramic Society, 2006, 89(2): 652-661. 被引量:1
  • 8KHACHATURYAN A G. Theory of structural transformations in solids [M]. New York: Wiley, 1983. 被引量:1
  • 9WANG J, ZHANG T Y. Size effects in epitaxial ferroelectric islands and thin films [J]. Physical Review B, 2006, 73: 144107. 被引量:1
  • 10曾令民,杨喜英,王力珩,李小萍,葛宪民.X射线衍射里特沃尔德全谱图拟合法测定粉尘中游离的SiO2[J].分析化学,2008,36(5):599-603. 被引量:16

引证文献2

二级引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部