摘要
设计了测试能量范围为0.6～6 keV的椭圆弯晶谱仪。此谱仪利用椭圆自聚焦原理,晶体分析器采用氟化锂材料,椭圆焦距为1 350 mm,离心率为0.958 6,布拉格角范围为30～65°。在神光Ⅱ靶室进行了实验,入射激光波长为0.35μm,激光功率约为1.6×1014W/cm2,与厚度为100μm的钛平面靶法线夹角约为45°。实验结果证实,弯曲的氟化锂晶体具有极佳探测效果,弯晶分析器对波长为0.2～0.35 nm的X射线的分辨率可达500～1 000,同时具有等光程而便于空间分辨测量的优点,在同样距离条件下比平晶分析器高一个数量级的收光效率,故适合于激光等离子体X射线的光谱学研究。
Based on the principle of elliptical focusing, an X-ray elliptical curved crystal analyzer whose measurement range, focal length, eccentricity and Bragg angel range are respectively 0.6～6 keV, 1350 ram,0. 9586 and 30°～60° was designed for investigating the laser producing plasmas. Aimed to the characteristic study of a high density plasma, a experiment was carried out with laser length of 0.35 μm,power of 1.6X 10^14 W/cm^2 ,and the incident angel on the Ti plane of 45°. The result shows that the sensitivity of elliptical curved LiF crystal has very good detection ability,its calculated wavelength resolution is about 500～1 000 in the range of 0.2～0.35 nm. Experimental results also show that the curved crystal analyzer can be used in spatial resolution measurement for aplanatic property,its sensitivity is higher than a flat crystal. It suggests that curved LiF crystal analyzer is suitable for plasma diagnostic.
出处
《光学精密工程》
EI
CAS
CSCD
北大核心
2007年第6期824-828,共5页
Optics and Precision Engineering
基金
国家自然科学基金资助项目(No.10576041)
关键词
晶体谱仪
弯晶分析器
等离子体诊断
积分反射率
Crystal spectrometer
crystal analyzer
plasma diagnosis
integrated reflectivity
