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裸芯片的IDDQ测试筛选方法研究

Research on Methods for IDDQ Testing Selection of Bare Chip
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摘要 IDDQ测试在裸芯片的测试筛选中非常有用,为了获得更高质量与可靠性的产品,许多公司在CMOS生产线中引入了IDDQ测试筛选技术,现在IDDQ测试筛选技术已经作为保证芯片可靠性的重要手段。本文介绍了IDDQ测试筛选技术的重要概念以及其在保证裸芯片可靠性方面的重要作用,并对深亚微米器件中的IDDQ测试筛选方法做了重点介绍。 IDDQ testing plays an imporpant role in testing and screening of bare die,It has been introduced to CMOS production lines for achieving higher quality and reliability.Many semiconductor companies now consider Iddq testing as an integral part of the overall testing for all IC's. This paper describes the present status of Iddq testing along with the essential items and necessary data related to Iddq testing.
作者 刘林春
出处 《电子质量》 2007年第6期35-37,共3页 Electronics Quality
关键词 IDDQ 裸芯片 筛选 IDDQ Dare die Screeing
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