摘要
带细缝屏蔽腔体耦合特性的分析对电子产品的设计、电子产品电磁兼容的预测具有重要的理论价值和应用价值。应用三维FDTD建模计算带细缝屏蔽体在外部干扰源作用下,屏蔽体内部的电场情况。当采用增强数值算法处理细缝时,计算的空间网格尺寸划分比腔体细缝尺寸大,可以减少计算时间和计算机CPU与内存资源利用率,所以本文应用了FDTD中的增强数值算法进行仿真研究,并得出结果进行分析。
Analysis of coupling characteristic of cavity with Thin-Slot has the theoretical value and applied value in design of electron product and estimate of EMC. Using the Finite-Differ-ence Time- Domain ( FD T D) method analyze coupling characteristic of cavity. In order to reduce time of calculation and resource of CPU and memory, so the size of space is small than thin-slot, we used the Enhanced Thin-Slot Formalism (ETSF) to resolve the problem. Finally, the result is educed and analy sed.
出处
《电气应用》
北大核心
2007年第5期52-55,共4页
Electrotechnical Application
基金
重庆市科委项目(2006BA1065)
关键词
细缝
ETSF
FDTD
耦合
电磁兼容
Thin-Slot
ETSF
FDTD
coupling
electro-magnetism
compatible