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高纯氘中杂质的低温气相色谱分析 被引量:9

Analysis Technique of Impurity in High Purity Deuterium by Cryogenic Gas-Chromatography
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摘要 实验研究采用5A分子筛和氧化铝充填色谱柱分别在常温和低温(77K)下对D2中的O2、N2以及H2、HD等杂质进行定量分析测量,以建立1种准确实用的分析方法。研究结果表明,该方法对H2、HD的最低检测浓度可达(150-200)×10^-6,能够满足高纯氘制备过程中对杂质的定量分析要求。 A veracious and applicable quantitative analysis method of O2, N2 and H2, HD in high purity deuterium by the chromatogram columniation filled with 5A molecular sieve and alumina was researched and constituted at natural temperature and 77 K, respectively. Minimum detecting limit of the present method is (150-200)× 10^-6 for H2 and HD, and it can meet the need of quantitative analysis of the impurity during high purity deuterium preparation.
出处 《原子能科学技术》 EI CAS CSCD 北大核心 2007年第3期356-360,共5页 Atomic Energy Science and Technology
基金 国防军工"十五"计划重点科研项目(J082001A008)
关键词 低温气相色谱 5A分子筛 定量分析 cryogenic gas-chromatography deuterium 5A molecular sieve quantitative analysis
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参考文献8

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