摘要
本文叙述了用ICP-AES法测定高Tc超导薄膜化学组成的方法。此法直接测出的是各被测元素的原子比,无须称量与准确稀释试样。方法简便、快速、用样量少(几十至几百微克)。分析了Bi-Sr-Ca-Cu-O及Tl-Ba-Ca-Cu-O超导薄膜。此法也可用于Y-Ba-Cu-O、Sr-La-Cu-O等薄膜的分析。
A method has been described for the determination of the chemical composition of high Tc superconducting thin films by ICP-AES.In this method, since atomic ratio of the elements studied is directly determined, accurate weighing and diluting of the sample are not necessary. The method is simple and rapid, and need only small quantity of sample (tens-several hundreds μg). Bi-Sr-Ca-Cu-O and TI-Ba-Ca-Cu-O superconducting thin films have been studied in detail, the method can be extended to the analysis of other superconducting thin films, such as Y-Ba-Cu-O, Dy-Ba-Cu-O and Sr-La-Cu-O systems, etc..
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1990年第8期769-772,共4页
Chinese Journal of Analytical Chemistry
关键词
超导薄膜
氧化物超导体
ICP-AES
Inductively coupled plasma-atomic emission spectrometry
Superconducting thin films
Bi-Sr-Ca-Cu-O
Tl-Ba-Ca-Cu-O
