摘要
采用分子束外延方法在GaAs衬底(001)上生长了AlAs/GaAs双势垒超晶格薄膜结构,测试出超晶格薄膜在室温下随着外加压力变化下,其I-V特性曲线的漂移与外加压力成一定比例关系。为基于MEMS共振隧穿效应的力电耦合传感器的研究提供了一定的基础。
Double potential barrier superlattiee quantum membrane made from AlAs/GaAs has been grown through molecular beam epitaxy technology on (001)-oriented GaAs substrates. Pressure-dependent current-voltage characteristics of superlattice film were studied in room temperature. Measured results show that the drift of I-V curve is proportional to the applied force. It provides a basis of research for electric-mechanical coupled transducer based on resonant tunneling effect.
出处
《兵工学报》
EI
CAS
CSCD
北大核心
2007年第2期178-181,共4页
Acta Armamentarii
基金
国家自然科学基金资助项目(50405025
50375050)
关键词
半导体技术
力电耦合
共振隧穿效应
超晶格薄膜
semiconductor
electric-mechanical coupled effect
resonant tunneling effect
superlattiee film