摘要
利用正硅酸乙酯(TEOS)做为无机前驱体,采用溶胶-凝胶(Sol_Gel)法,制备了SiO2含量一定,固体含量不同的聚酰亚胺/二氧化硅(PI/SiO2)纳米杂化薄膜。采用傅立叶变换红外光谱(FT_IR)、原子力显微镜(AFM)、热重分析(TGA)等方法研究了杂化薄膜的结构与性能。AFM分析显示:SiO2粒子均匀分散在PI树脂中。随固体含量增加,SiO2粒子的平均粒径变大,有机相与无机相的界面变清晰;当固体含量为20%(质量分数)时,两相出现明显的相分离。TGA结果表明:引入一定含量的SiO2,有助于提高PI/SiO2纳米杂化薄膜的热稳定性;当固体含量高时,杂化薄膜的热稳定性下降。
Polyimide/silica nano-hybrid films of different solid content were prepared via the sol-gel route using tetraethoxysilane （TEOS） as inorganic precursor. The chemical structure, morphology and thermal property were characterized by methods of Fourier Transform Infrared Spectroscopy （FT-IR）, Atomic Force Microscope （AFM）, Thermogravimetric Analysis （TGA）. The micrographs of AFM indicate that silica particles are finely dispersed in polymer resin. The sizes of silica particles increase and the tendency of interconnected network between two phases decrease with the increasing of solid content. When the solid content is 20wt%, phase separation between two phases appears. The results of TGA confirm that the thermal decomposition temperature of hybrid films increase with some content of silica added, When the solid content is more than 15wt%, the thermal stability of hybrid film decreases
出处
《绝缘材料》
CAS
2006年第6期35-37,41,共4页
Insulating Materials
基金
国家自然科学基金重点资助项目(50373008)
