摘要
掩模板制造过程中采用的是分步啁啾方法,分步间长度容易出现误差,这种接缝误差是引起啁啾光纤光栅(CFBG)时延纹波的系统误差。理论分析了相位掩模板的接缝误差对CFBG时延纹波的影响。分析表明,对长度为140mm的掩模板采用1.4mm的步长,接缝误差影响最小。并进行了实验验证。
The chirped electron-beam written phase mask is fabricated by step-chirped method. The step-chirped phase mask is a useful and powerful device to realize a nonlinearly or linearly stepwise chirped fiber grating with broad bandwidth. But the stitching errors of electron-beam written phase masks always occur between neighboring sections. The stitching errors can arouse the time delay ripple of chirped fiber Bragg gratings（CFBGs）.The 140 mm CFBGs,which are written by using 2.0 mm,1.4 mm,1.0 mm and 0.5 mm stepwise chirped phase mask, have been studied by simulation and experiment. The best is the 1.4 mm step-chirped mask. The simulation agrees with the experiment well.
出处
《光电子．激光》
EI
CAS
CSCD
北大核心
2006年第12期1409-1412,共4页
Journal of Optoelectronics·Laser
基金
国家"863"计划资助项目(2004AA31G200)
国家自然科学基金资助项目(60477017)
北京市自然科学基金资助项目(4052023)
霍英东基金资助项目(91062)
教育部新世纪优秀人才支持计划资助项目
