摘要
在阳离子表面活性剂——十六烷基三甲基溴化铵（ＣＴＭＡＢ）的存在下，用比浊法对铝箔蚀腐液中微量硫酸根离子进行测定。硫酸根离子含量在３．０×１０－４～２．
Traces of sulfate ions in etching solution for aluminum foil have been determined by turbidimetry in presence of cation surface activator-hexadecyl trimethyl ammonium bromide (CTMAB). The Beer's law is obeyed for content of sulfate ions from 3 0×10 -4 to 2 4×10 -3 g per 55 mL.
出处
《电子元件与材料》
CAS
CSCD
1996年第4期55-56,共2页
Electronic Components And Materials
关键词
硫酸根离子
测定
铝箔腐蚀液
sulfate ion, determination, hexadecyl trimethyl ammonium bromide(CTMAB)
