期刊文献+

X射线荧光光谱法测定黄铜中铜、铅、铁、铋、锑、磷、砷 被引量:9

Determination of Copper,Lead,Iron,Bismuth,Antimony,Phosphorus and Arsenic in Brass by X-ray Fluorescence Spectrometry
下载PDF
导出
摘要 采用波长色散X射线荧光光谱仪测定黄铜中铜、铅、铁、铋、锑、磷和砷。考察了试样表面质量对测量结果的影响,并对黄铜中元素间的吸收增强效应进行了研究。实验发现,吸收效应对黄铜的分析结果有较大影响,需用理论α影响系数进行基体效应校正。采用本法分析了多种黄铜标准样品(普通黄铜、加砷黄铜和特殊黄铜),结果显示,普通黄铜和加砷黄铜的分析结果与标称值相符。文中还给出了方法的实验室内和实验室间的精密度试验结果。 Sequential X-ray fluorescence spectrometer has been used to determine copper, lead, iron, bismuth,antimony,phosphorus and arsenic in brass. The influence of sample surface status on analysis results was tested, and the absorbability and enhancement between elements were studied. The theoretical a influence coefficents were used to correct the matrix effects. The results showed that the absorbability had large influence on the determination. The developed method was applied to the analysis of 49 brass standard samples(29 common brass, 20 special brass), the analysis results were consistent with the certified value. The repeatability and reproducibility of this method were also given in this paper.
出处 《分析科学学报》 CAS CSCD 2006年第5期519-522,共4页 Journal of Analytical Science
基金 国家质量监督检验检疫总局B31-98号行业标准制定项目
关键词 X射线荧光光谱 黄铜 X-ray fluorescence spectrometry Brass Copper
  • 相关文献

参考文献6

  • 1National Standard of the People's Republic of China(中华人民共和国国家标准).Copper and Copper Alloy(铜及铜合金化学分析方法)[S].GB/T5121.1~23-1996.Beijing(北京):Standards Press of China(中国标准出版社),1996. 被引量:1
  • 2毛振伟.X射线荧光光谱理论α系数法测定古青铜钱币中的铅铜锡[J].光谱学与光谱分析,1999,19(5):738-741. 被引量:4
  • 3李叶农,郑荣华,黄近丹,张文芳.X荧光能谱法测定磷青铜、青铜标样中铜与锡[J].光谱实验室,1997,14(1):55-57. 被引量:2
  • 4National Standard of the People's Republic of China(中华人民共和国国家标准).Surface Roughness-Parameters and Their Values(表面粗糙度参数及其数值)[S].GB/T1031-1995.Beijing(北京):Standards Press of China(中国标准出版社),1995. 被引量:1
  • 5Japanese Industrial Standard.Method for X-ray Fluorescence Spectrometric Analysis of Copper and Copper Alloys[S].JIS H1292-199. 被引量:1
  • 6Buhrke V E,Jenkins R,Smith D K.A Practical Guide for Preparation of Specimens for X-ray Fluorescence and X-ray Diffraction analysis[M].New York:Wiley & Sons,1998:83. 被引量:1

二级参考文献7

共引文献4

同被引文献153

引证文献9

二级引证文献42

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部