摘要
受生物免疫系统基本原理的启发,提出了半导体器件可靠性免疫系统的概念。在介绍半导体器件的过激噪声和其内部不同缺陷之间的关系的基础上,阐述了利用噪声评估器件可靠性的原理及优点。借鉴生物免疫系统,较为详细的介绍了人工免疫系统的相关机理,并给出了半导体器件可靠性免疫系统内抗原(过激噪声)、淋巴细胞(判据)的表现形式,淋巴细胞对不可靠器件的识别过程等。实验结果表明:该方法具有快速,可靠等优点,并具有很好的适应性。
According to the inspiration of the immune system basic principle of living beings, the concept of the reliability immune system of semiconductor device was put forward. The principle and advantage of utilizing the noise to assess the reliability of the device was explained based on introduction about excess noise of semiconductor device and the relation between its noises and inside different defects. Referencing the biological immune system, the relevant mechanism of the artificial immune system was introduced. The expression forms of the antigen （excess noise）, lymphocyte （criterion） in the reliability immune system of semiconductor device and the discernment course of the lymphocyte to unreliable devices were provided. The experimental results show that this method is expeditious, reliable and well adaptable.
出处
《电子器件》
EI
CAS
2006年第3期868-873,共6页
Chinese Journal of Electron Devices
基金
吉林省自然科学基金资助(20030313
20040521)
吉林大学创新基金资助(2003CX038)
关键词
生物启发
半导体噪声
可靠性
人工免疫
bio-inspired
noise of semiconductor
reliability
artificial immune
