摘要
The microstructure of diamond films was studied by slow positron beam and Raman spectroscopy. For the Raman spectroscopy experiment on diamond films, a high fraction of the sp3 hybridized bond was detected in samples. Positron annihilation spectra analysis further illuminated that the concentration and types of defects were different in each sample. S-E curves of all samples showed that diamond crystal structures had obvious variation in each sample. These results indicated that positron annihilation spectroscopy was an effective means to measure microstructure of diamond films.
基金
V. ACKN0WLEDGMENT This work was supported by the National Natural Science Foundation of China （No.10425072） and the National High Technology Research and Development Program of China （2003AA84ts18）.
