摘要
通过对边界扫描测试过程以及TAP的16种状态的分析,总结出边界扫描测试的核心操作,归纳出相应的核心指令,设计出一种边界扫描测试主控器的MCU控制器,并用FPGA实现。由于采用了控制器的实现方式以及具有扫描长度设置指令使得具有测试自动化程度高、灵活高效、成本低的优势。另外还单独配有指令用于和BIST功能配合。
After investigating the Boundary-Scan-Test process and the 16-states TAP, the core operations is obtained and the core instruction set is figured out. A MCU for test master is designed based on these instructions and implemented by FPGA. The MCU is highly automatic, flexible, efficient and low-cost as the overlapping executing of instructions and Set-Length instruction, which make the test process more effective and the storage module more efficient for test data. A special instruction is included to cooperate with BIST function of BS device friendly.
出处
《微计算机信息》
北大核心
2006年第08Z期260-262,208,共4页
Control & Automation
基金
广东省自然科学基金项目(No.5301033)
深圳大学科研启动基金200501
