摘要
讨论了半导体发光薄膜的光致发光谱修正要点。光致发光结果受到氙灯的光强、温度及薄膜表面的平整度等因素的限制,使得结果可比性差。采用了标准偏差的方法修正了数据,使其具有可比性。
This paper discussed the emendation of the luminescent spectra of semiconductor films. The photoluminescence （PL） results are affected by the intensity of Xe lamp, temperature and the surface status of films, which decreases the comparability of PL results. By introducing the standard deviation to correct data, it clarifies the relative intensity of different samples at different detective conditions.
出处
《实验室研究与探索》
CAS
2006年第4期418-420,共3页
Research and Exploration In Laboratory
基金
国家自然科学基金(50402010)
天津市自然科学重点基金(043800711)
关键词
分光光度计
光致发光谱
标准偏差
薄膜
溅射
spectrophotometer
PL spectra
standard deviation
films
sputtering
