期刊文献+

激光光热反射技术对薄膜热物性的表征 被引量:8

Thermal Characterization of Film-on-Substrate Systems by Laser Photothermal Reflectance Technique
原文传递
导出
摘要 在考虑探测光束光斑尺寸对调制光热反射(MPR)信号影响的基础上,建立了三维的薄膜-衬底体系的激光光热反射理论模型。对利用激光光热反射技术测量薄膜热物性的可行性进行了研究,并对影响调制光热反射信号的材料参数进行了分析。此外,通过数值模拟研究了多参数拟合问题,即利用调制光热反射频响信号同时确定薄膜热扩散率、衬底热扩散率和界面热阻这三个物理参数。结果表明,与已有的径向扫描方法相比,频率扫描方法中的这三个参数之间并不存在高度的相关性,因此采用频响信号进行多参数拟合,可提高多参数拟合的收敛性和精确性。 Considering the influence of the probe beam size on the modulated photothermal reflectance (MPR) signal, a three-dimensional theoretical model of laser-induced MPR for the thin film on-substrate system is presented in this paper. The feasibility of measuring the thermal parameters on thin films by MPR techniques is investigated. The effects of the material parameters on MPR signals are discussed in detail. The numerical multiparameter estimation of thermal properties is also performed in this paper using the frequency response of MPR signals (i. e. MPR frequency scanning method). Three thermal parameters, i.e. the filmrs thermal diffusivity, the substrate's thermal diffusivity and the thermal resistance on the film-substrate boundary, are simultaneously determined. It is shown that, comparing with the conventional MPR radial scanning method, there is no strong correlation among the three thermal parameters in MPR frequency scanning model. Therefore the convergence and the accuracy of multiparameter estimation for samples can be improved by MPR frequency scanning method.
出处 《中国激光》 EI CAS CSCD 北大核心 2006年第3期385-390,共6页 Chinese Journal of Lasers
基金 浙江省自然科学基金(Y104574)资助项目
关键词 激光技术 光热反射 多参数拟合 热扩散率 界面热阻 laser technique photothermal reflectance multiparameter estimation thermal diffusivity thermal boundary resistance
  • 相关文献

参考文献13

  • 1M. Depriester, P. Hus, S. Delenclos et al. New methodology for thermal parameter measurements in solids using photothermal radiometry[J]. Rev. Sci. Instrum, 2005, 76:074902-1-074902-6. 被引量:1
  • 2Peiji Wang, Fengjun Zhang, Xueren Dong et al. Study on thermal diffusivity of materials by laser photothermal reflection technique[J]. Chin. Opt. Lett, 2003, 1(3):162-164. 被引量:1
  • 3王培吉,张仲,范素华.利用激光光热技术研究材料应力对热扩散率的影响[J].中国激光,2003,30(3):252-254. 被引量:3
  • 4钟可君,唐志列,陈更生,卢非,李凌燕.一种实现光声光谱的导数光谱的新方法[J].光学学报,2005,25(9):1288-1292. 被引量:3
  • 5D. Dietzel, B. K. Bein, J. Pelzl. Systematical analysis of laser beam modulated optical reflectance signals[J]. Rev. Sci.Instrum,2003, 74(1):604-607. 被引量:1
  • 6J. L. N. Fotsing, M. Hoffmeyer, S. Chotikaprakhan et al.Laser modulated optical reflectance of thin semiconductor films on glass[J]. Rev. Sci. Instrum. , 2003, 74(1):873-876. 被引量:1
  • 7J. Hartmann, P. Voigt, M. Reichling. Measuring local thermal conductivity in polycrystalline diamond with a high resolution photothermal microscope[J]. J. Appl. Phys. ,1997, 81(7) :2966-2972. 被引量:1
  • 8G. Langer, J. Hartmann, M. Reichling. Thermal conductivity of thin metallic films measured by photothermal profile analysis[J]. Rev. Sci. Instrum, 1997, 65(3):1510-1513. 被引量:1
  • 9Bicheng Li, L. Pottier, J. P. Roger et al. Thermal characterization of film-on-substrate systems with modulated thermorefleetance microscopy[J]. Rev. Sci. Instrum, 2000,71(5) :2154-2160. 被引量:1
  • 10S. Orain, Y. Scudeller, S. Garcia et al. Use of genetic algorithms for the simultaneous estimation of thin films thermal conductivity and contact resistances[J]. Int. J. Heat Mass Transfer, 2001, 44:3973-3984. 被引量:1

二级参考文献18

共引文献4

同被引文献86

引证文献8

二级引证文献33

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部