期刊文献+

A Novel Algorithm to Extract Weighted Critical Area

提取带权关键面积的新算法(英文)
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摘要 inductive fault analysis is a technique for enumerating likely bridges that is limited by the weighted critical area computation. Based on the rectangle model of a real defect and mathematical morphology, an efficient algorithm is presented to compute the weighted critical area of a layout. The algorithm avoids the need to determine which rectangles belong to a net and the merging of the critical area corresponding to a net pair. Experimental resuits showing the algorithm's performance are presented. 导体故障分析是一种列举与缺陷有关的集成电路版图中可能出现桥连的技术,计算带权关键面积是限制其性能的主要因素.文中提出了一种基于数学形态学和真实缺陷矩形模型提取带权关键面积的新算法,该算法不需要将版图上的线网拆分为矩形,也不需要合并矩形对的带权关键面积.实验结果验证了新算法的有效性.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第1期24-29,共6页 半导体学报(英文版)
基金 国家高技术研究发展计划资助项目(批准号:2003AA1Z1630)~~
关键词 bridge fault defect rectangle model layout analysis mathematical morphology 桥形故障 矩形缺陷模型 版图分析 数学形态学
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参考文献16

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