摘要
通过CCD传感技术把光学量——单缝衍射光强转化为电学模拟量,继而进行模数转换,最后用单片机系统进行数据处理,降低光学量测量的工作强度,获得较高的实验精度,取得较好的实验效果。
The determination of light intensity distributing in single slit diffraction has been completed by the CCD sense technology. It translates optical into electrical quantum and converts modulus, then processes data by SCM system to reduce the work intensity of using optical quantum measurement and obtain higher experimental precision and better experimental results.
出处
《江苏技术师范学院学报》
2005年第4期1-7,共7页
Journal of Jiangsu Teachers University of Technology
关键词
电荷耦合器件(CCD)
模数转换
单片机
单缝衍射光强分布
charger coupled device （CCD）
modulus converting
single chip
single slit diffraction spectral detection
