摘要
数字电路的各种仪器设备中,数字IC的应用较广。那么,如何正确检测数字片的性能,判断故障所在,文中提出了静态检测、逻辑功能检测、逻辑比较等几种常用的方法。
Digital IC applying broadly in the digital circuit instrument . The essay offered static ,logic detection and comparison as to digit chips＇ features and failure judging approaches.
关键词
IC芯片
静态检测
逻辑功能检测
逻辑比较
IC Slice
Static Detection
Logic-functional Detection
Logic Comparison
