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硅衬底CMOS射频集成电路中金属厚度对平面螺旋电感Q值的影响 被引量:3

Effect of Metal Thickness on Quality Factor of Planar Spiral Inductors in Si-based CMOS RF ICs
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摘要 该文着重分析金属线厚度对Q值的影响.为此设计了三组电感,它们的金属线厚度分别为51、0和20μm,并用Ansoft HFSS软件进行FEM(finite element method)的仿真.仿真的结果表明,金属线厚度对电感Q值的影响在很大程度上取决于电感内径的大小.因此当金属线厚度超过10μm时,通过进一步增加金属线厚度来改善Q值仍是可能的. The effect of metal thickness on the quality factor of planar spiral induetors is simulated and analyzed. Three types of induetors with metal thickness of 5 - 20 μm were designed and simulated by FEM using Ansoft HFSS. It is shown that the metal thickness effect on the Q-factor depends on the diameter of the innermost turn in a planar spiral inductor. Therefore it is possible to further improve Q-factors by increasing the metal thickness bevond 10 μm.
出处 《上海大学学报(自然科学版)》 CAS CSCD 北大核心 2005年第5期455-459,共5页 Journal of Shanghai University:Natural Science Edition
关键词 平面螺旋电感 金属线厚度 串联电阻 Q值 RF集成电路 planar spiral inductor metal thickness series resistance Q value RF IC
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参考文献7

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共引文献1

同被引文献25

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