摘要
本文采用Ｘ射线衍射和透射电子显微镜研究了纳米晶体Ｓｅ的微观结构特征．通过测定不同晶粒尺寸的纳米晶体Ｓｅ的点阵参数ａ和ｃ，发现纳米晶体Ｓｅ中存在晶格畸变，畸变量与晶粒尺寸有关．得到了纳米晶体Ｓｅ中晶胞体积变化与晶粒尺寸的关系．并由点阵参数计算出纳米晶体Ｓｅ的键长．用非晶态Ｓｅ中的无规链折叠的晶化机制解释了纳米晶体Ｓｅ中晶格畸变现象．
The microstructural feature of nanocrystalline Se (nc-Se) was investigated by using XRD and TEM. The lattice distortions were found from the quantitative XRD measurements, from which the dependence of the lattice distortions and cell volume changes on the grain sizes were obtained. and the bond lengths of the nc-Se were calculated as well. The experimental result of the lattice distortion in the nc-Se was explained in view of the crystallization micromechanism of random-coil chains folding.
出处
《金属学报》
SCIE
EI
CAS
CSCD
北大核心
1995年第3期B123-B128,共6页
Acta Metallurgica Sinica
关键词
纳米晶体
点阵参数
晶格畸变
硒
晶
nanocrystalline material, selenium, lattice parameter, lattice distortion. cell volume
