摘要
文章介绍法中两国合作开发的微电子电路计算机辅助教育系统中的两部分，重点陈述其中的辅助测试虚拟仪器和专用实验芯片，期望对电子测试领域的教育工作者和科技工作者有所启发．
The paper presents briefly a micro-electronics computer aided education system, which has ben developed by the collaboration of France and China. The part of a PC virtual instrument and an experimental chip called JISI are stated in detail.It woul be served as a source of inspiration for the teachers, engineers and researchers,that work in the electronics measurement field.
出处
《电子测量与仪器学报》
CSCD
1995年第3期20-27,共8页
Journal of Electronic Measurement and Instrumentation
关键词
微电子
CAD
CAT
Micro-electronics
Computer Aided Design CAD
Computer Aided Test CAT
