摘要
讨论了测试性或机内测试（BIT）和监控子系统的设计要求，描述了BIT性能参数、数学模型和确定测试性要求的程序。并提出了确定故障检测率、故障隔离率和虚警率要求值的方法。这对于制定BIT、监控／诊断子系统的技术规范是非常重要的。
The design requirements for testability or Builtin test (BIT) and moniter subsystem are discussed. The parameters of BIT Performance. mathematical models and procedures of determining testability requirements are described. A method to determine requiring value of fault detection rate. fault isolation rate and false alarm rate are also presented. It is very important for developing specification of BIT and monitor/diagnostic subsystem.
出处
《测控技术》
CSCD
北大核心
1995年第6期9-12,共4页
Measurement & Control Technology
关键词
测试性
机内测试
故障检测率
隔离率
testability, built-in test (BIT),fault detection rate, fault isolation rate, false alarm rate
