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数字电路测试中的虚拟测试资源模型研究 被引量:2

Virtual test resource model for digit circuit test
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摘要 针对数字电路测试中对测试资源管理方法通用性的需求,以测试泛环境ABBET(ABroad BasedEnvi ronmentforTest)资源管理软件接口和IEEE1445标准为基础,采用面向信号的测试资源管理方法,构建了虚拟测试资源模型,论述了虚拟测试资源模型的基本组成.在数字电路测试中,通过使用虚拟测试资源模型来隔离测试软件和硬件设备,使ATS中仪器和信号通道的变化与测试软件的开发及使用没有关联性,从而实现测试软件对仪器访问控制的通用性.以实际电路板为被测对象,对基于虚拟测试资源模型开发的TPS(TestPro gramSet),选取两套不同厂家的数字电路ATE设备作为运行的硬件平台,测试结果表明:TPS可以运行在不同的ATE上,实现了测试资源管理方法的通用性,提高了数字电路TPS的适用性. Considering the generalization of test resource management in digital circuit test, the virtual test resource model, applying the signal oriented test resource management method and being based on the software interface for resource management for A broad-based environment for test and IEEE1445, was introduced. The signal oriented test resource control interface, the capability description of digital circuit test instrument, the interconnections description of the signal adapter devices, and translating the logic test device′s command to the given physic device′s control command in the model was described. The test software does not depend on the test instruments, the changes of test instruments and signal channels will not affect the development of fault diagnosis software. Take two digital circuit ATE instruments form different manufactories as the running hardware platforms, test program Set (TPS) developed by the model was used to the actual circuit board. It is seen that the TPS can run on the two different platforms, with generalization of test resource management realized and applicability of digital circuit TPS improved.
出处 《华中科技大学学报(自然科学版)》 EI CAS CSCD 北大核心 2005年第7期8-10,共3页 Journal of Huazhong University of Science and Technology(Natural Science Edition)
关键词 数字电路 虚拟测试资源 自动测试系统 设备互换性 digital circuit virtual test resource automatic test system instrument interchangeability
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参考文献6

  • 1Neblett Bill. Implementing reusable, instrument independent test programs in the factory[J]. IEEE Aerospace and Electronic Systems Magazine. 1997, 12(6): 29-34 被引量:1
  • 2Cheij D. Using interchangeable virtual instrument (IVI) drivers to increase test system performance[J]. IEEE Aerospace and Electronic Systems Magazine, 2001, 16(7): 8-11 被引量:1
  • 3Chandra Anshuman, Chakrabarty Krishnendu. Test data compression and test resource partitioning for system-on-a-chip using frequency-directed Run-length(FDR) codes[J]. IEEE Transactions on Computers, 2003, 52(8): 1 076-1 088 被引量:1
  • 4陈亮,魏蛟龙,史慧.基于IEEE1445标准的电路故障诊断技术研究[J].信息技术与标准化,2003(12):30-33. 被引量:4
  • 5IEEE Std 1226.3-1998.IEEE Standard for Softwate Interface for Resource Management for A Broad-Based Environment for Test(ABBET).1998. 被引量:1
  • 6IEEE Std 1445-1998 Supplement to IEEE Std 1445.IEEE Guide for Digital Test Interchange Format Application.1998. 被引量:1

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