摘要
目前的系统芯片(SOC)制造技术已经进入了深亚微米时代,由于系统芯片内部信号传输线发生串扰而导致系统功能失效的串扰故障问题不容忽视。文中在对系统芯片中信号传输线的串扰产生性质进行深入研究的基础上,提出一种简单有效的系统芯片串扰故障激励检测模型——基于搜索的MAF模型。对使用这种串扰故障激励模型的效率和已有的MAF模型进行了对比。结果显示在串扰较弱时,其所需的检测矢量数和已有的MAF模型相当;而在串扰较严重时,这种新的串扰故障激励检测模型只需较少的激励检测矢量即可以完成对所有串扰故障的激励检测。
As System-on-Chip (SOC) manufacture technology moves into deep submicron (DSM) ear, crosstalk faults between interconnections of a SOC result in improper function of th chip. This problem currently is becoming more and more severe. In this paper, we presented a simple and efficient fault model—Search-Based Maximal Aggressor Fault (SB-MAF) model to stimulate and detect crosstalk faults based on the in-depth research of the property of crosstalk fault. The respective efficiency of using the presented model and the MAF model is given in the paper. The results of simulation show that two models' efficiency is comparative when crosstalk is weak. However, the efficiency of the presented model in this paper is obviously improved compared to the MAF model when there are strong crosstalk effects between interconnects of a SoC.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
2005年第2期235-240,共6页
Research & Progress of SSE
基金
国家自然科学基金资助项目(No.90207020)
