摘要
以波导耦合理论为依据,设计了集光电为一体的波导衰减系数测量系统。测量以激光为光源,采用双光路法,消除了传统检测显示仪由于光源光强不稳定产生的误差,使得测量结果只与光强的相对变化量有关;利用AD538实时模拟计算芯片,提高了计算精度和运算速度;利用常规仪器设备实现了数字化检测显示,避免了人为主观读数产生的误差。该系统亦可应用于介质折射率及分光镜分光比等光学参量的测量。
This article is based on coupling theory and has been designed the incorporating photoelectricity measuring device of waveguide modulus decay. In the course of testing, the laser is used as light source with twinlight path, the error of lightintensity variation of traditional detection devices is dispelled, the measurement result is only relates to the relative change of optical intensity. The realtime simulation chip of AD538 is used,it has greatly improved the calculation precision and operating speed. The system makes use of some conventional equipment to realize digitized detection display technique and avoid the errors in reading. This system can be also applied to the measurement of optical parameters such as refractometry and light splitting ratio of spectrometer, etc.
出处
《现代电子技术》
2005年第12期114-116,共3页
Modern Electronics Technique
关键词
波导
衰减系数
光强
AD538
waveguide
modulus decay
optical intensity
AD538
