摘要
本文介绍的ＨＰ测试仪与ＩＢＭＰＣ微机构成的系统集测量与数据处理于一体，成功地实现了半导体参数的快速测量和提取，为集成电路的设计和开发提供了有效的手段．着重介绍ＧＰＩＢ测控总线与ＩＢＭＰＣ系统总线的接口原理及软／硬件实现方法．
This paper Presents an interface technique for a Semiconductor Parameters automatic mcasurcmcnt & extraction system which is formed by a HP Semiconductor Parameter Analyzer and an IBM Personal Computer. The system can determine out semiconductor device model. Parameters rapidly by automatic mcasurcmcnt and optimization, and is very useful for iC design and developnlent. We will focus on interfacing software /hardware implementation for the GPIB and IBM PC bus intcrrace.
出处
《微电子学与计算机》
CSCD
北大核心
1994年第2期18-20,共3页
Microelectronics & Computer
关键词
半导体参数
自动测量
接口设备
Microcomputer,Measurement,Interface,Parameter
