摘要
本文提出了一种关于非立方晶系晶体的Ｘ－射线粉末图的指标化方法，它利用由单晶测得的晶胞参数，通过我们导出的晶胞参数和衍射指标的关系，结合实验数据，便可对非立方晶系的Ｘ－射线粉末图指标化。
In this paper, another index method of X-ray powder diffraction pattern was proposed. By the crystallographic data , it calculated the sin2 θ of all diffrations and compared the result with the experiment, indexing the powder diffraction pattern.
关键词
非立方晶系
晶体
X射线
粉末图
X-ray powder diffraction pattern
index method
