摘要
本文讨论以功能块为单位的数字电路测试产生与故障模拟中的一些基本问题，包括功能快的描述，故障模型，故障效应的传播，扇出重汇聚，功能块划分成单元，整个电路划分成锥体，锥体中的截面等问题，其中有些概念是门级电路中类似概念在功能块级电路中的推广。
In this paper, some basic problems of test pattern generation and fault simulation of digital circuits consist of functional blocks are discussed extensively. The problems as description of functional block, fault model,propagation of fault effect, reconvergent fanout, partition the func.tional block ascells,partition the whole circuit as cones, and the sections of cone etc. are discussed in detail. Some conceptions of gate level circuits are extended to the functional block level circuits.
出处
《电子测量与仪器学报》
CSCD
1994年第3期1-9,共9页
Journal of Electronic Measurement and Instrumentation
关键词
功能块级
故障
电路测试
故障模拟
Functional block level circuit
Fault model
Fault effect
Reconvergent fanout
Cone
Section
