摘要
同步辐射作为一种新型光源的出现，给Ｘ射线应用领域的各学科注入了新的活力，世界上许多国家纷纷建造同步辐射加速器并投入使用，使同步辐射的应用得到空前的发展，同步辐射Ｘ射线荧光分析就是其中的一个重要方面．文章讨论了常规Ｘ射线荧光分析的局限性，概略地描述了同步辐射在荧光分析方面的优越性，指出它为Ｘ射线荧光分析技术带来的新突破 痕量元素的检测和微区扫描分析，简要介绍了国际及国内同步辐射Ｘ射线荧光分析的水平及现状，并展望了以后的发展方向．
The advent of synchrotron radiation sources has brought new energy into various fields of X-ray application. including X-ray fluorescence analysis (XRFA). In this paper, we discuss the shortcomings of the conventional XRFA. and the advantages of using synchrotron radiation in XRFA(SR-XRFA), as well as the significance of SR-XRFA in trace element detection and mi- cro-area seanning analysis. A brief overview on the present status of SR-XRFA both in China and abroad is given, and the future development of SR-XRFA in China is diseussed.
出处
《物理》
CAS
北大核心
1993年第9期553-558,共6页
Physics
