摘要
目的用cDNA微阵列技术研究 +Gz重复暴露大鼠脑应激基因表达谱 ,探讨 +Gz引起脑损伤的分子机制。方法Wistar大鼠随机分成对照组和 +Gz重复处理组 ,对照组大鼠G值为 + 1Gz ,实验组大鼠在动物离心机上经历了 3次 + 1 0Gz/1min(两次间隔 30min)作用 ,于暴露后 6h处死大鼠取脑。分别从+Gz处理组和对照组大鼠脑中提取总RNA ,用α 32 PdATP逆转录标记作为探针。将合成的 2种cDNA探针分别与具有 2 0 7个濡激基因的cDNA微阵列杂交 ,灰度扫描后分析两者表达谱差异。结果有 1 5个应激基因在 +Gz处理组表达升高。结论 +Gz重复暴露可引起脑组织中多个基因表达变化 ,这些基因的表达变化是脑损伤在基因水平上的表现 ,而cDAN微阵列是一种筛选差异表达基因的快速有效方法。
Objective To investigate the stress gene expression profile in rat brain after repeated +Gz exposure, and to explore the molecular mechanism of brain damage induced by repeated +Gz exposures. Method Wistar rats were randomly divided into control group and repeated +Gz exposure group. Using an animal centrifuge, the control group rats were exposed to +1 Gz and the experimental group rats were exposed to +10 Gz for 3 times, each for 1 min with 30 min interval. The brains were taken 6 h after the last centrifugation and the total RNA were isolated. The cDNA probes were prepared by labeling rat brain tissue total RNA of rats in the control and the repeated +Gz exposure group with α- 32P dATP through reverse transcription. The two cDNA probes were separately hybridized to cDNA microarrays with 207 stress genes. The signals were scanned and analyzed. Result There were 15 genes showing up-regulated expression in rat brain tissue of the repeated+Gz exposure group. Conclusion It suggests that repeated +Gz exposures could induce expression change of many genes in rat brain, the changed expression of these genes may play important roles in the pathologic or repair course of brain damage induced by+Gz exposures. The cDNA microarray is a rapid and effective method to select genes with different expressions.
出处
《航天医学与医学工程》
CAS
CSCD
北大核心
2004年第6期434-437,共4页
Space Medicine & Medical Engineering
基金
空军后勤部科研基金课题 (KH99190 76)
关键词
+GZ
正加速度
脑
cDNA
微阵列
应激基因
表达谱
Gz
positive acceleration
brain
cDNA
microarray
stress gene
expression profile
