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温度对焊点可靠性的影响 被引量:1

Reliablity Effect of Temperature on the Reliablity of Solder Point
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摘要 本文叙述了焊点失效的机理和热循环对焊点可靠性的影响。 This paper describes the failure mechanism of solder point,and reliablity effeet of thermal circulationtesting on the solder point.
作者 杨峰
出处 《印制电路信息》 2004年第10期55-57,共3页 Printed Circuit Information
关键词 对焊 焊点可靠性 热循环 失效 thermal circulation reliablity solder point
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同被引文献15

  • 1李志民.焊点的质量与可靠性[J].信息技术与标准化,2004(8):27-30. 被引量:3
  • 2顾永莲,杨邦朝.无铅焊点的可靠性问题[J].电子与封装,2005,5(5):12-16. 被引量:23
  • 3黄春跃,周德俭,吴兆华.基于全面析因试验的塑封球栅阵列器件焊点可靠性[J].西安交通大学学报,2005,39(7):753-756. 被引量:10
  • 4薛松柏,胡永芳,禹胜林.CBGA焊点热循环条件下的可靠性[J].焊接学报,2005,26(10):81-83. 被引量:11
  • 5Tee T Y,Nq Hun Shen,Lim Chwee Teck,et al,Impact lifeprediction modeling of TFBGA packages under board level drop test[J].Microelectronics Reliability,2004,44(7):1131-1142. 被引量:1
  • 6Yunus M,Srihari K,Pitarresi J M,et al,Effect of voids on the reliability of BGA/CSP soldered joints[J].Microelectronics Reliability,2003,43(12):2077-2086. 被引量:1
  • 7Stam F A,Davitt E.Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints[J].Microelectronics Reliability,2001,41(11):1815-1822. 被引量:1
  • 8Pang H L J,Tan K H,Shi X Q,et al.Microstructure and intermetallic growth effects on shear and fatigue strength of solder joints subjected to thermal cycling high temperature storage[J].Materials Science and Engineering A,2001,307(1):42-50. 被引量:1
  • 9Ahmed Sharif,Chan Y C.Interfacial reaction on electrolytic Ni and electroless Ni(P) metallization with Sn-In-Ag-Cu solder[J].Journal of Alloy and Compounds,2005,393(1):135-140. 被引量:1
  • 10Yang W H,Chang P R,Chan K K.Aprogrammable MVDR beamformer by switched-capacitor circuits[C].Microwave Conference Proceedings,1993,1(1):68-73. 被引量:1

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