摘要
根据 Alq3 +的不稳定性模型 ,通过水分子的电离产生 OH-,然后在 Alq3 层中引入Alq3 + 陷阱的方法 ,分析了器件中水气的存在对器件寿命的影响 ,表明当 OLEDs内水浓度达到一定值时 ,才会对 OLEDs寿命产生显著影响 ,而且寿命与 H2 O的浓度成反比 ,与电场强度的指数成反比。
We discusse the influence of H_2O on OLEDs lifetime in the paper. Based on the unstability model of Alq_3^+, ionization of H_2O can produce OH^- and then Alq_3^+ trap is introduced in Alq_3.It shows that H_2O can influence OLEDs lifetime remarkably when H_2O concentration in OLEDs is above the threshold. OLEDs lifetime is reciprocal to H_2O concentration and exponentially reciprocal to field intensity.
出处
《光电子技术》
CAS
2004年第3期169-170,173,共3页
Optoelectronic Technology
