摘要
利用能量为 2 0GeV的13 6Xe和 2 7GeV的2 3 8U离子对C60 薄膜进行了辐照 ,并用傅立叶变换红外光谱、X射线衍射谱和拉曼散射技术分析了辐照过的C60 样品 ,在傅立叶变换红外光谱上 ,首次观察到一个位于 6 70cm-1处的 ,表征未知结构的新峰 ,研究了其强度随电子能损和辐照剂量的变化规律 .分析结果表明 ,电子能量转移主导了C60 薄膜的损伤过程 ;而损伤的部分恢复是由强电子激发的退火效应引起的 ;另外 。
Strong electronic excitation effect of C 60 films induced by 2 0 GeV 136Xe and 2 7GeV 238U ions was investigated by means of Fourier transform infrared (FTIR), Raman Scattering and X-ray diffraction (XRD) spectroscopies. A new peak located at 670 cm -1, which corresponds to an unknown structure, was observed in the FTIR spectra of C 60 films irradiated for the first time. The variation in intensity of 670 cm -1 peak with electronic energy loss and irradiation dose were studied. The analysis results indicated that electronic energy transfer dominates the damage process of C 60 films. The partial recovery of the damage in irradiated C 60 films at middle electronic energy loss is attributed to an annealing effect of the strong electronic excitation. The ion velocity also plays a role in the process of the damage creation.
出处
《高能物理与核物理》
CSCD
北大核心
2004年第7期781-785,共5页
High Energy Physics and Nuclear Physics
基金
国家自然科学基金资助项目 ( 10 175 0 84
10 12 5 5 2 2 )~~
